News & Events
August 29, 2011 -
XOS Introduces the CLORA On-Line Chlorine Analyzer for Crude Oil, Water and Process Streams — XOS (USA) announces the introduction of its latest breakthrough product — the CLORA® On-Line Analyzer — for continuous on-line measurement of chlorine in crude, water, and high viscosity process streams. This solution satisfies industry demand for chlorine determination in upstream, desalting, and refining operations for corrosion management, environmental, and process control applications.
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July 27, 2011 -
XOS files lawsuit against Innov-X Systems Inc. - UPDATE - On July 26, 2011 the Court dismissed Innov-X’s counterclaim against XOS in its entirety. XOS is now moving forward with its main claims against Innov-X.
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March 31, 2011 -
The U.S. Consumer Product Safety Commission Approves New Test Method for Detection of Lead in Paint - XOS’s HDXRF Technique, as Described in ASTM F2853-10, Receives Key Federal Approval - The U.S. Consumer Product Safety Commission (CPSC) unanimously approved a new test method to measure lead in paint and other surface coatings of children’s products and household furniture. This development significantly expands the government approved options for lead testing and provides a powerful new analysis solution to industry for the measurement of lead in paint in children’s products to comply with the CPSIA. (See notice - http://www.cpsc.gov/library/foia/foia11/brief/lead100rev.pdf)
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March 28, 2011 -
XOS Installs 1,000th SINDIE® Analyzer, Reflecting Strong Growth in Major Petroleum Markets - SINDIE helps Sinopec measure sulfur in fuel refining - XOS announces the installation of its 1,000th SINDIE 7039 sulfur analyzer. This analyzer was installed at the Yanshan refinery of the China Petroleum & Chemical Corporation (the Sinopec Corporation).
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February 10, 2011 -
XOS files lawsuit against Innov-X Systems Inc. - On February 9, 2011, XOS, a leader in X-ray optics, components, and analyzers, filed a lawsuit against Innov-X Systems, Inc., a Massachusetts company.
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January 14, 2011 -
ASTM Award of Excellence Presented to XOS Vice President Berry Beumer - XOS Vice President of Marketing and Sales, Berry Beumer, was presented an ASTM Award of Excellence at ASTM’s recent meeting of Committee D02 in Jacksonville, Fla. This award acknowledges extensive contributions in drafting and promoting standard test methods across several ASTM Committees including D02, D16, and F40.
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January 5, 2011 -
TUV Rheinland to Deploy XOS' HDXRF Analyzer for Consumer Product Testing in Bentonville, ARK and Hong Kong Labs - Analyzers to Test for Hazardous Elements in Consumer Products – XOS, a leading provider of mission-critical materials analysis solutions for industries and regulators, announces that TUV Rheinland has purchased two state-of-the-art HD Prime analytical instruments for the detection of lead and other regulated hazardous elements in consumer products.
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December 21, 2010 -
XOS Introduces the SIGNAL Analyzer - Better Silicon Detection Counts - XOS (USA) announces its latest product introduction – the Signal analyzer – featuring XOS’s robust, widely used Monochromatic Wavelength Dispersive X-Ray Fluorescence (MWD XRF) to detect Silicon down to 0.5 ppm with the XOS-exclusive advantage of unprecedented precision at the push of a button. Signal effectively eliminates extensive sample preparation associated with ICP while offering better precision in a 10-minute measurement cycle: Placing the sample in a standard XRF sample cup is the only handling required for the measurement. This Silicon quantification capability is available for petroleum matrices, additives and bio-fuels, including ethanol.
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December 21, 2010 -
XOS Introduces HD MAXINE - Trace Metals Detection using HD XRF- XOS (USA) announces that the HD Maxine, its newest analysis solution for parts-per-million trace metal analysis in hydrocarbon matrices, offers the XOS-exclusive advantage of one-touch results and unrivaled precision – without extensive sample prep, consumable gasses, and long measurement cycles. The Maxine analyzer uses XOS’s state-of-the-art HD XRF technology platform to detect elements from Vanadium to Selenium at sub-ppb concentrations in such applications as crude oil and lubricants.
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December 6, 2010 -
Complimentary XOS Webinar - On December 16, 2010 XOS offers a complimentary 1 hour Webinar on "HOT NEW ISSUES UNDER CPSIA."
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November 22, 2010 -
U.S. Consumer Product Safety Commission to Deploy XOS Analyzer for Consumer Product Testing – XOS, a leading provider of mission-critical materials analysis solutions for industries and regulators, announces that the U.S. Consumer Product Safety Commission (CPSC) has awarded the company a contract to purchase an HD Prime, a state-of-the-art analytical instrument to be used for the detection of lead and other regulated elements in consumer products.
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August 9, 2010 -
Toy Industry Association article on new method ASTM F2853 for toy testing - A new standard published by ASTM International – the same standards body that maintains the ASTM F963 Toy Safety Standard - will provide the means to quickly detect and quantify the lead concentration in toys and other children's products.
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August 1, 2010 -
ASTM Declarable Substances Committee Approves New Lead Paint Testing Standard - A new ASTM International standard will provide the means to quickly detect and quantify the lead concentration in toys and other children's products.
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July 15, 2010 -
XOS Announces Approval of New ASTM Method for Measuring Lead in Paint and Substrates in Consumer ProductsXOS leads effort to offer reliable, lower cost alternative to traditional lead testing
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February 22, 2010 -
XOS Demonstrates New Technology for Detection of Cadmium in Children's Jewelry -- HDXRF Instrument Helps Enable Enforcement of Senator Schumer Bill. XOS today demonstrated to U.S. Senator Charles Schumer the company's new High Definition XRF (HDXRF) for the detection of toxic metals in children's jewelry. HDXRF provides the most precise, non-destructive measurement of cadmium, lead, and other heavy metals in the consumer-products industry. This breakthrough technology was developed by XOS and is currently in use by retailers, manufacturers, government labs, and third party testing labs to detect for toxic elements before the products get into the hands of consumers. "New York is fortunate to have forward thinking companies like XOS," stated Senator Schumer. "By developing innovative technologies like the HDXRF they are not only addressing an important consumer issue but they are also creating jobs."
Related news coverage: WTEN-ABC, WNYT-NBC, WRGB-CBS, FOX23 @ 5, FOX23 @ 10, Capital News 9, Times Union, Troy Record.
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XOS Demonstrates New Technology for Detection of Cadmium in Children's Jewelry -- HDXRF Instrument Helps Enable Enforcement of Senator Schumer Bill. XOS today demonstrated to U.S. Senator Charles Schumer the company's new High Definition XRF (HDXRF) for the detection of toxic metals in children's jewelry. HDXRF provides the most precise, non-destructive measurement of cadmium, lead, and other heavy metals in the consumer-products industry. This breakthrough technology was developed by XOS and is currently in use by retailers, manufacturers, government labs, and third party testing labs to detect for toxic elements before the products get into the hands of consumers. "New York is fortunate to have forward thinking companies like XOS," stated Senator Schumer. "By developing innovative technologies like the HDXRF they are not only addressing an important consumer issue but they are also creating jobs."
Related news coverage: WTEN-ABC, WNYT-NBC, WRGB-CBS, FOX23 @ 5, FOX23 @ 10, Capital News 9, Times Union, Troy Record.
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February 15, 2010 -
XOS Cutting Edge Technology on Display at Toy Fair and Consumer Product Health and Safety Annual Meeting -- HDXRF allows manufacturers and retailers to tackle the serious issue of lead and cadmium in children's products - NEW YORK, NY and WASHINGTON, D.C. - XOS, a global manufacturer of analysis systems is featuring their High Definition XRF (HDXRF) technology at both the 2010 American International Toy Fair in New York City (February 14-17) and the International Consumer Product Health and Safety Organization (ICPSHO) Annual Meeting and Symposium in Washington, D.C. (February 15-18). The HDXRF technology provides the most precise measurement of lead and cadmium in the industry.
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February 11, 2010 -
HDXRF allows manufacturers and retailers to tackle the serious issue of cadmium in children's products - ALBANY, NY - As news reports of high levels of cadmium in children's toys continue to hit front pages across the country, the toy industry gets ready for the 2010 American International Toy Fair in New York City, (February 14-17). XOS, a global manufacturer of analysis systems will be featuring their High Definition XRF (HDXRF) technology, which provides the most precise measurement of lead and cadmium in the industry.
Related news coverage: WNYT-NBC Channel 13
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Related news coverage: WNYT-NBC Channel 13
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January 14, 2010 -
XOS Provides instruments to detect cadmium in children's products
Recently, the U.S. Consumer Product Safety Commission (CPSC) launched an investigation into the presence of cadmium, a highly toxic and carcinogenic metal, in children's jewelry and other children's products. While this metal is presently limited by federal law with regard to paint on toys and other consumer products, there is no specific regulation limiting cadmium in the jewelry itself, or other toy bodies, frames, substrates, etc. Several members of Congress have indicated their intent to pursue legislation to establish such limits.
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Recently, the U.S. Consumer Product Safety Commission (CPSC) launched an investigation into the presence of cadmium, a highly toxic and carcinogenic metal, in children's jewelry and other children's products. While this metal is presently limited by federal law with regard to paint on toys and other consumer products, there is no specific regulation limiting cadmium in the jewelry itself, or other toy bodies, frames, substrates, etc. Several members of Congress have indicated their intent to pursue legislation to establish such limits.
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December 10, 2009 -
XOS, Developer of Next Generation HDXRF Analytical Solutions, Responds to Recent Scrutiny of XRF for Testing Zhu Zhu Toys
In the past few days there has been a good deal of media attention, and some controversy, surrounding reports by "GoodGuide.com" about the alleged presence of toxins in the popular "Zhu Zhu" toy hamster. In response to those reports, the effectiveness and reliability of XRF (X-ray Fluorescence) technology to quantify various substances in toys and other consumer products has come under scrutiny. XOS' HDXRF technology answers this scrutiny.
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In the past few days there has been a good deal of media attention, and some controversy, surrounding reports by "GoodGuide.com" about the alleged presence of toxins in the popular "Zhu Zhu" toy hamster. In response to those reports, the effectiveness and reliability of XRF (X-ray Fluorescence) technology to quantify various substances in toys and other consumer products has come under scrutiny. XOS' HDXRF technology answers this scrutiny.
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October 30, 2009 -
XOS Attends CPSC 2009 China Summit on Product Safety
XOS is pleased to report that it was selected as one of twenty (20) stakeholders in the US delegation to the 3rd Biennial United States - China Consumer Product Safety Summit between the United States Consumer Product Safety Commission (CPSC) and its counterpart agency, the General Administration of Quality Supervision, Inspection, and Quarantine of the People's Republic of China (AQSIQ) held in Wuxi, Jinhua, and Beijing, China, October 21-26, 2009.
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XOS is pleased to report that it was selected as one of twenty (20) stakeholders in the US delegation to the 3rd Biennial United States - China Consumer Product Safety Summit between the United States Consumer Product Safety Commission (CPSC) and its counterpart agency, the General Administration of Quality Supervision, Inspection, and Quarantine of the People's Republic of China (AQSIQ) held in Wuxi, Jinhua, and Beijing, China, October 21-26, 2009.
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September 8, 2009 -
XOS Wins IBO Award for its SINDIE On-The-Go (OTG) Sulfur Analyzer
XOS announces that its innovative and portable SINDIE OTG sulfur analyzer has received a 2009 IBO Industrial Design Award for portable instruments. The Industrial Design Awards recognize the best in industrial design of analytical and life sciences instruments, portable instruments, and laboratory equipment.
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XOS announces that its innovative and portable SINDIE OTG sulfur analyzer has received a 2009 IBO Industrial Design Award for portable instruments. The Industrial Design Awards recognize the best in industrial design of analytical and life sciences instruments, portable instruments, and laboratory equipment.
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January 5, 2009 -
XOS Introduces the HD 1000 Lead Analyzer to Screen and Certify Toys
Today XOS introduces the HD 1000 Lead Analyzer uniting the speed and ease-of-use of conventional XRF analyzers with the precision and accuracy of chemical techniques. The HD 1000 is now ready to meet industry needs for both screening and certification to new federally mandated lead levels going into effect beginning February 2009. This new technology covers every base, from analyzing raw materials to checking finished product inventory.
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Today XOS introduces the HD 1000 Lead Analyzer uniting the speed and ease-of-use of conventional XRF analyzers with the precision and accuracy of chemical techniques. The HD 1000 is now ready to meet industry needs for both screening and certification to new federally mandated lead levels going into effect beginning February 2009. This new technology covers every base, from analyzing raw materials to checking finished product inventory.
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July 22, 2007 -
XOS Launches Total Chlorine Analyzer
XOS announced the introduction of a bench-top total chlorine analyzer. The Clora analyzer is a breakthrough analytical solution for determination of chlorides in liquid hydrocarbon samples, such as aromatics, distillates and heavy fuels as well as in aqueous solutions.
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XOS announced the introduction of a bench-top total chlorine analyzer. The Clora analyzer is a breakthrough analytical solution for determination of chlorides in liquid hydrocarbon samples, such as aromatics, distillates and heavy fuels as well as in aqueous solutions.
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July 21, 2007 -
XOS Launches Extended Range Software Package
XOS announced the introduction of the SINDIE 7039 XR software package, enabling SINDIE 7039 users to determine sulfur concentration from 0.4 ppm to 100,000 ppm. Just one intuitive and robust analyzer with all the precision benefits of Monochromatic WD XRF per ASTM D 7039.
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XOS announced the introduction of the SINDIE 7039 XR software package, enabling SINDIE 7039 users to determine sulfur concentration from 0.4 ppm to 100,000 ppm. Just one intuitive and robust analyzer with all the precision benefits of Monochromatic WD XRF per ASTM D 7039.
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May 1, 2007 -
XOS-Bartec Benke Distribution Announcement
XOS Inc. and Bartec Benke of Reinbek, Germany, have entered into an agreement for the distribution and technical service of the XOS line of process sulfur analyzers, marketed under the SINDIE name.
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XOS Inc. and Bartec Benke of Reinbek, Germany, have entered into an agreement for the distribution and technical service of the XOS line of process sulfur analyzers, marketed under the SINDIE name.
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March 27, 2007 -
SINDIE Bench-Top Analyzer Sales Announcement
Horiba Instruments (HII) and XOS Inc. have agreed that beginning March 27, 2007, XOS will assume responsibility for sales and distribution of its SINDIE line of bench-top sulfur analyzers for the petroleum industry.
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Horiba Instruments (HII) and XOS Inc. have agreed that beginning March 27, 2007, XOS will assume responsibility for sales and distribution of its SINDIE line of bench-top sulfur analyzers for the petroleum industry.
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October 16, 2006 -
Dr. Chen Accepts ISA Award
Dr. Chen received ISA’s previously-announced 2006 Arnold O. Beckman Founder Award, at a black tie dinner during the ISA conference in Houston, Texas. Dr. Chen accepted the award before about 500 attendees, and graciously acknowledged the entire XOS team contributing to the success of the project, some of whom accompanied him to Houston for the ISA conference.
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Dr. Chen received ISA’s previously-announced 2006 Arnold O. Beckman Founder Award, at a black tie dinner during the ISA conference in Houston, Texas. Dr. Chen accepted the award before about 500 attendees, and graciously acknowledged the entire XOS team contributing to the success of the project, some of whom accompanied him to Houston for the ISA conference.
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September 28, 2006 -
XOS Wins the Tech Triumph Award
The Small Business Council of the Albany-Colonie Regional Chamber of Commerce presented this award to an organization on the cutting edge of technology that possesses the core strengths to succeed, leading the future of Tech Valley. The Small Business Council promotes the recognition and importance of small businesses to the economic growth of the Capital Region and the Tech Valley.
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The Small Business Council of the Albany-Colonie Regional Chamber of Commerce presented this award to an organization on the cutting edge of technology that possesses the core strengths to succeed, leading the future of Tech Valley. The Small Business Council promotes the recognition and importance of small businesses to the economic growth of the Capital Region and the Tech Valley.
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June 2, 2006 -
XOS Expands Manufacturing Capabilities
X-Ray Optical Systems (XOS), a world leader in X-ray optics, components and analyzers announced today it is expanding its manufacturing space by 10,000 square feet at the company's East Greenbush headquarters. "Our rapid growth has been fueled by an ever increasing demand for our products, particularly our sulfur analyzer, which is designed for a wide spectrum of petroleum fuels including gasoline, ultra-low sulfur diesel and heavy fuel oil. The demand for these analyzers has resulted in the need for additional manufacturing space," said XOS CEO David Gibson.
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X-Ray Optical Systems (XOS), a world leader in X-ray optics, components and analyzers announced today it is expanding its manufacturing space by 10,000 square feet at the company's East Greenbush headquarters. "Our rapid growth has been fueled by an ever increasing demand for our products, particularly our sulfur analyzer, which is designed for a wide spectrum of petroleum fuels including gasoline, ultra-low sulfur diesel and heavy fuel oil. The demand for these analyzers has resulted in the need for additional manufacturing space," said XOS CEO David Gibson.
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January 17, 2006 -
XOS Inventor Named Regional Inventor of the Year
The Eastern New York Intellectual Property Law Association (ENYIPLA) awarded Dr. Zewu Chen the Inventor of the Year Award for 2006, in connection with his monochromatic X-ray optic and fluorescence patents.
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The Eastern New York Intellectual Property Law Association (ENYIPLA) awarded Dr. Zewu Chen the Inventor of the Year Award for 2006, in connection with his monochromatic X-ray optic and fluorescence patents.
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November 16, 2005 -
XOS Receives Manufacturing Award
XOS received the International Trade Award in the Small/Medium Manufacturer category from the Capital Region World Trade Center. This award recognized XOS' creative efforts in promoting international export activity from the Capital Region. XOS establishes unique agreements with companies worldwide providing XOS exclusive sales and rights to the technology overseas, backed by the resources of very large and respected companies.
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XOS received the International Trade Award in the Small/Medium Manufacturer category from the Capital Region World Trade Center. This award recognized XOS' creative efforts in promoting international export activity from the Capital Region. XOS establishes unique agreements with companies worldwide providing XOS exclusive sales and rights to the technology overseas, backed by the resources of very large and respected companies.
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September 14, 2005 -
XOS SINDIE Analyzer Wins R&D 100 Award
R&D Magazine's extensive evaluation team determined that XOS' SINDIE® analyzer was one of the 100 most technologically significant new products introduced worldwide. The invention and application of monochromatic wavelength dispersive X-ray fluorescence to measure sulfur in petroleum products enables refineries and pipelines to meet the U.S. Environmental Protection Agency's Clean-Air Mandates. This will aid in reducing acid rain and asthma-inducing particulates.
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R&D Magazine's extensive evaluation team determined that XOS' SINDIE® analyzer was one of the 100 most technologically significant new products introduced worldwide. The invention and application of monochromatic wavelength dispersive X-ray fluorescence to measure sulfur in petroleum products enables refineries and pipelines to meet the U.S. Environmental Protection Agency's Clean-Air Mandates. This will aid in reducing acid rain and asthma-inducing particulates.
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August 14, 2005 -
SPIE Honors Dr. Walter Gibson at Annual Conference
SPIE held a symposium in Honor of Dr. Walter Gibson's 75th birthday at its annual conference in San Diego. Fifty years ago, coincident with the founding of SPIE, Walter Gibson published an article in the 100th volume of Physics Review, the first of his more than 300 articles in refereed journals. Dr. Gibson founded X-ray Optical Systems, Inc. (XOS) in 1990.
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SPIE held a symposium in Honor of Dr. Walter Gibson's 75th birthday at its annual conference in San Diego. Fifty years ago, coincident with the founding of SPIE, Walter Gibson published an article in the 100th volume of Physics Review, the first of his more than 300 articles in refereed journals. Dr. Gibson founded X-ray Optical Systems, Inc. (XOS) in 1990.
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April 5, 2005 -
XOS Receives Innovation Award
XOS received the Market Innovator Award from The Center for Economic Growth. This award is given to the company which best identifies customers having unmet needs, and then reaches across advanced technology sectors to develop a viable solution.
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XOS received the Market Innovator Award from The Center for Economic Growth. This award is given to the company which best identifies customers having unmet needs, and then reaches across advanced technology sectors to develop a viable solution.
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July 14, 2004 -
XOS Superconducting Tape Analyzer Wins R&D 100 Award
R&D Magazine's extensive evaluation team determined that XOS' Tabletop X-Ray Diffraction System was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with Superpower, Inc. and the New York State Energy Research and Development Authority on this project. The system uses X-rays to continuously measure some of the critical material parameters for long lengths of superconducting tape. The ability to monitor the quality is critical for commercial introduction of superconductors for power transmission. The X-ray analysis technique can also be used for quality control in numerous other environments.
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R&D Magazine's extensive evaluation team determined that XOS' Tabletop X-Ray Diffraction System was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with Superpower, Inc. and the New York State Energy Research and Development Authority on this project. The system uses X-rays to continuously measure some of the critical material parameters for long lengths of superconducting tape. The ability to monitor the quality is critical for commercial introduction of superconductors for power transmission. The X-ray analysis technique can also be used for quality control in numerous other environments.
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July 13, 2004 -
XOS Confocal Microscope Wins R&D 100 Award
R&D Magazine's extensive evaluation team determined that XOS' Confocal X-Ray Fluorescence Microscope was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with Los Alamos National Laboratory on this project. The microscope can non-destructively measure compositions of subsurface materials. It sees beneath the surface, providing depth profiles of the composition. Target applications include multilayer electronic materials, defect analysis, and analyzing works of art such as historical paintings.
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R&D Magazine's extensive evaluation team determined that XOS' Confocal X-Ray Fluorescence Microscope was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with Los Alamos National Laboratory on this project. The microscope can non-destructively measure compositions of subsurface materials. It sees beneath the surface, providing depth profiles of the composition. Target applications include multilayer electronic materials, defect analysis, and analyzing works of art such as historical paintings.
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June 7, 2004 -
XOS Receives Commercialization Award
Acting for the U.S. Department of Energy, Dawnbreaker awarded XOS the prestigious Outstanding Commercial Achievement Award. This award recognizes XOS' success in identifying market needs and transitioning DOE funded technology to meet those needs. This technology started out as a portable parallel beam X-ray diffraction system for the in-line process control in the steel industry. It has since transitioned to a process for measuring sulfur particles in fuel both at the benchtop and on-line with market focus on refineries, pipelines, and terminals.
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Acting for the U.S. Department of Energy, Dawnbreaker awarded XOS the prestigious Outstanding Commercial Achievement Award. This award recognizes XOS' success in identifying market needs and transitioning DOE funded technology to meet those needs. This technology started out as a portable parallel beam X-ray diffraction system for the in-line process control in the steel industry. It has since transitioned to a process for measuring sulfur particles in fuel both at the benchtop and on-line with market focus on refineries, pipelines, and terminals.
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May 1, 2004 -
XOS Technology Receives ASTM Industry Standard
XOS successfully championed an Industry Standard for measuring sulfur in petroleum products through the American Society for Test and Measurement (ASTM), the internationally respected standards-setting organization for such methods. This standard, ASTM D-7039, provides the basis for EPA certification of the method and widespread industrial use of XOS technology in the petroleum industry for this important application. XOS is the only supplier of equipment that satisfies this method.
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XOS successfully championed an Industry Standard for measuring sulfur in petroleum products through the American Society for Test and Measurement (ASTM), the internationally respected standards-setting organization for such methods. This standard, ASTM D-7039, provides the basis for EPA certification of the method and widespread industrial use of XOS technology in the petroleum industry for this important application. XOS is the only supplier of equipment that satisfies this method.
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November 6, 2003 -
XOS Launches SINDIE Analyzer
X-Ray Optical Systems, Inc. (XOS), East Greenbush, today launched production of its advanced, on-line and bench-top analyzers for measuring minute amounts of sulfur in motor fuels. The devices are critical to petroleum refiners and marketers in meeting U.S. Environmental Protection Agency ultra-low sulfur regulations for on-road diesel and gasoline, set to begin in 2006. These regulations aim to reduce sulfur-oxide exhaust emissions that form acid rain, and ultra-fine particles associated with adverse health effects.
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X-Ray Optical Systems, Inc. (XOS), East Greenbush, today launched production of its advanced, on-line and bench-top analyzers for measuring minute amounts of sulfur in motor fuels. The devices are critical to petroleum refiners and marketers in meeting U.S. Environmental Protection Agency ultra-low sulfur regulations for on-road diesel and gasoline, set to begin in 2006. These regulations aim to reduce sulfur-oxide exhaust emissions that form acid rain, and ultra-fine particles associated with adverse health effects.
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January 14, 2002 -
XOS Donates Optics
XOS donated custom X-ray optics to support life science research at University at Albany. This donation provided world-leading capabilities to the strong research team at the University. The optics are being used to demonstrate the feasibility of improving life science applications. This is expected to expand the use of devices that would be based on XOS' optics in many areas beneficial to society.
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XOS donated custom X-ray optics to support life science research at University at Albany. This donation provided world-leading capabilities to the strong research team at the University. The optics are being used to demonstrate the feasibility of improving life science applications. This is expected to expand the use of devices that would be based on XOS' optics in many areas beneficial to society.
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June 14, 1996 -
XOS Receives Photonics Spectra Award
XOS received the Circle of Excellence Award which Photonics Spectra Magazine presents this to acknowledge the 25 best products of the year. XOS' polycapillary optics were honored, which provide more than an order of magnitude increase in usable flux from conventional X-ray sources, for many material analysis applications.
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XOS received the Circle of Excellence Award which Photonics Spectra Magazine presents this to acknowledge the 25 best products of the year. XOS' polycapillary optics were honored, which provide more than an order of magnitude increase in usable flux from conventional X-ray sources, for many material analysis applications.
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June 14, 1995 -
XOS Glass Polycapillary Focusing Optic Wins R&D 100 Award
R&D Magazine's extensive evaluation team determined that XOS' Glass Polycapillary Neutron Focusing Optic was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with the University at Albany, and the U.S. National Institute of Standards and Technology on this project. The optic provides an intensity increase of an order of magnitude greater than 10, providing a performance enhancement that would otherwise cost significantly more in upgrades to existing neutron research facilities.
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R&D Magazine's extensive evaluation team determined that XOS' Glass Polycapillary Neutron Focusing Optic was one of the 100 most technologically significant new products introduced worldwide. XOS collaborated with the University at Albany, and the U.S. National Institute of Standards and Technology on this project. The optic provides an intensity increase of an order of magnitude greater than 10, providing a performance enhancement that would otherwise cost significantly more in upgrades to existing neutron research facilities.
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