Excitation Systems: X-Beam
The successful coupling and ability to maintain precise alignment of an X-ray source to an optic is integral to the success of the optic to enhance an analytical application. The X-Beam® system is a fully integrated X-ray beam solution including an air-cooled X-ray source coupled to either a polycapillary or doubly curved crystal optic which ensures source/optic alignment and stability of the output intensity and spot position of the optic.
The source and optic are aligned by an innovative alignment mechanism which provides active, continuous compensation for variations in optic and X-ray source manufacture as well as changes in operating conditions, such as source power setting and ambient temperature that may cause spot shift. The optic is adaptively positioned using closed-loop feedback control, to maintain a fixed output beam position and intensity with enhanced performance over conventional source-optic combinations.
The X-Beam package is very compact and is equipped with a high-voltage power supply, built-in cooling fan and shutter/filters in addition to the desired source and optic. In addition, the source is completely shielded. So, except for the sample region, no external enclosure is required.
All X-Beam models are available in standard beam configurations or can be tailored to customized beam requirements.
X-Beam® Models:
| Model | Type | Applications |
| Powerflux PF | Polychromatic focusing | µXRF, in-situ and in-line process monitoring, small particle analysis, film and plating thickness, elemental mapping |
| Superflux PF | Polychromatic focusing | µXRF, in-situ and in-line process monitoring, small particle analysis, film and plating thickness, elemental mapping |
| Powerflux PC | Polychromatic collimating | Powder diffraction applications such as texture, stress, and strain measurements |
| Powerflux PS | Polychromatic slightly focusing | μXRF for single crystals and powders |
| Superflux PC | Polychromatic collimating | Powder diffraction applications such as texture, stress, and strain measurements |
| Superflux PS | Polychromatic slightly focusing | μXRF for single crystals and powders |
| Superflux MF | Monochromatic focusing | MμXRF, in-situ and in-line process monitoring, small particle analysis, elemental mapping, thin film metrology |
General Features of X-Beam:
| Nominal Output Power | 50W, 1 mA (75W and 100W available on Powerflux models) |
| Stability | < 0.5% RSD over 8 hours |
| Ambient Operating Temperature | 20 – 30 °C |
| Cooling Mode | Integrated forced air |
| Targets | Cr, Cu, Mo Rh ,Ag (on MF and PF models only) |
| Optional Features | Integrated shutter module, Integrated filter assembly |